是德科技 電子量測論壇 

Keysight World Tech Day 2025 是年度科技盛會，集結產業領袖與技術專家，探索未來技術應用與創新突破。今年活動以「AI 為核心理念」，貫穿三大主論壇，深入探討 AI 在通訊、電動車、高速運算等領域的實際應用與影響。

在「後 5G 與 6G」論壇中，您將了解如何以 AI 提升頻譜及網路效率、推進 NTN 技術，實現全球無縫連接；「AI 賦能與高速數位」聚焦資料中心 PCIe 6.0/7.0、224G/448G 高速介面、CPO/LPO、Chiplet 等技術突破，分享信號完整性與自動化測試的最佳實踐；「汽車產業革新」則探討 SDV、ADAS 感測、車載網路、V2X 車聯網、EV 充電與 V2G 電網互聯等最新應用與量測挑戰。

現場精心安排多項關鍵技術展示，如毫米波訊號分析、AI 伺服器高速介面測試、EV 電池模組可靠度驗證、與量測自動化平台等，讓與會者親身體驗最前沿的測試技術。無論您來自通訊、半導體、汽車或雲端領域，Keysight World Tech Day 將提供豐富的技術洞察與實用知識，加速 AI 驅動的創新旅程。

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專題演講：

· Unleash AI Potential / Kailash Narayanan, SVP & President of Communications Solutions Group, Keysight

· Recent Progress of CPO for High-Speed Data Center / Hao-Chung Kuo Ph.D., Director of Semiconductor Research Center, Honhai Research Institute

論壇主題：

Advancing 5G and Next-Generation Communication

· Integrated Sensing and Communication (ISAC): Unlocking New Capabilities in 6G

· Beyond 5G Evolution and the Road to 6G

· B5G and 6G Spectrum: Maximizing Spectrum Efficiency

· Evolution of Non-Terrestrial Network Architecture for Seamless Transition to 6G

· AI-Driven Intelligence and Energy Efficiency in Future Networks

· Device Security for the B5G and 6G Networks

   實現全球無線連接   

Scaling High-Speed Infrastructure for the AI Era​

· AI Momentum Explosion: Reshaping Future Infrastructure with Compute,Interconnect, Network and Power

· Shaping Tomorrow's AI Fabric: Equalization and Validation Strategies for the 448G Era

· The Road to PCIe® 7.0: Advanced Testing Challenges at 32 Gbaud PAM4

· Accelerating Digital Interface Signal Integrity & Test Automation: USB4, DP2.1, PCIe 5/6 Cases

· Taming 64 GT/s: Use Cases & Applications for PCIe 6.0 Redrivers

· Elevating PCIe 6.0/7.0 Receiver Testing with Advanced Techniques

· Enabling the AI Era: Redefining High-Speed Measurements for Next-Gen Digital Interfaces

   AI 賦能與高速數位   

Driving Success in SDV and EV Innovation

· AI Innovations in the Automotive Industry

· From Lab to Road: Securing the Next Generation of Technology

· V2X Use Cases and Solutions According to the Product Lifecycle

· Scaling the Future of EV and Charging Ecosystems

· Effective Antenna Aperture for Full Vehicle Antenna Testing

· Characterizing ReRAM and WBG Power Devices: Advancing AI Hardware Development

   探討 SDV、ADAS 感測   

與會好禮：

現場互動可兌換各式好禮，填寫問卷還可以參加會後抽獎活動！

* 主辦單位保有最終修改變更贈品及活動解釋權

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